Circuit Card Testing In Manufacturing

Date(s) - 04/18/2016
3:00 pm - 5:00 pm

Avon Lake Public Library

Categories No Categories

To reserve your seat please RSVP below by April 15

Sponsors: IEEE Region 2, IEEE Cleveland Section, IEEE Life Members

Presenter: Sol Black

In this one hour presentation, Mr. Black, explains the various techniques to test electronic circuit cards in a manufacturing environment. He covers disciplines such as Product-Testing-Product, Functional Testing, and Boundary Scan (JTAG IEEE 1149.X), but concentrates on In Circuit Testing as this is the fastest way to test products as well as the method having the highest fault coverage.
This is a fast moving and entertaining discussion which combines humor with a lot of technology. It is not an academic speech but a real hands-on description of what is done in the industry. There are short entertaining explanatory skits such as “Two guys in a bar in Boston” and “A little girl with a red marker.”  Although students will find this talk especially informative, practicing Engineers will also learn a considerable amount from it.

Mr. Black is a retired Senior Test Engineer from Western Electric/AT&T/Lucent Technologies. He was responsible for Design For Testability and Test Development at Lucent. He has also consulted in the field, spent time at Celestica Technologies, and is still working in the field, part-time, at LSI/ADL Technologies. He resides in a suburb of Columbus, Ohio. He is Membership Chair of the Columbus Section and past Chair, Vice Chair, and Secretary. He had also served many years as Communications Society Chair of the Columbus Section.

Date & Time:
April 18, 2016
3:00 to 5:00PM

Avon Lake Public Library
32649 Electric Blvd
Avon Lake, OH 44012

Door Opens @ 3:00 PM
Presentation @ 3:30 PM
Light refreshments will be served.

Who Is Invited?
Anyone interested in this topic, although priority will be given to pre-registered IEEE Cleveland Section members

One (1) CPD Hours Available
Bring your flyer for credit


Bookings are closed for this event.